Author Correspondence author
Triticeae Genomics and Genetics, 2024, Vol. 15, No. 2 doi: 10.5376/tgg.2024.15.0009
Received: 15 Feb., 2024 Accepted: 20 Mar., 2024 Published: 30 Mar., 2024
Zhu J.H., 2024, Quantitative Trait loci (QTL) mapping in wheat: success stories and lessons learned, Triticeae Genomics and Genetics, 15(2): 88-99 (doi: 10.5376/tgg.2024.15.0009)
Quantitative Trait Loci (QTL) mapping has revolutionized the field of wheat genetics and breeding, enabling the identification of genomic regions associated with key agronomic traits. This study provides a comprehensive overview of the advancements and achievements in QTL mapping for wheat (Triticum aestivum L.), discussing successful cases and lessons learned, with a particular focus on its applications in improving grain yield, quality, and stress resistance. The study delves into methodological advancements, including traditional methods and modern technologies such as high-resolution genetic mapping, advanced statistical methods, and multi-parent cross designs. These advancements have significantly enhanced the precision and accuracy of QTL detection. It also addresses the challenges encountered in QTL mapping, such as environmental interactions and genetic background effects, and introduces strategies to overcome these obstacles, including integrated approaches and the use of high-density maps. Future directions for QTL mapping are explored, emphasizing the integration with genomic selection, improving precision and efficiency through new technologies, and applying these methods to other crops. QTL mapping has profoundly impacted wheat breeding programs, providing tools and insights that facilitate the development of high-yielding, high-quality, and stress-resistant wheat varieties. These findings underscore the importance of continued research and technological integration in advancing global food security and agricultural sustainability.
. PDF(957KB)
. FPDF(win)
. FPDF(mac)
. HTML
. Online fPDF
Associated material
. Readers' comments
Other articles by authors
. Jinghuan Zhu
Related articles
. Wheat
. Quantitative trait loci (QTL)
. Genetic mapping
. Grain quality
. Yield potential
Tools
. Email to a friend
. Post a comment