Author Correspondence author
Triticeae Genomics and Genetics, 2024, Vol. 15, No. 3
Received: 20 Apr., 2024 Accepted: 24 May, 2024 Published: 05 Jun., 2024
This study aims to elucidate the technological advancements and applications of high-density genetic mapping methodologies in identifying genetic loci associated with key agronomic traits in wheat, thereby enhancing wheat breeding and research. High-density genetic mapping has led to several key discoveries, including the identification of numerous quantitative trait loci (QTL) linked to yield, disease resistance, and abiotic stress tolerance. High-resolution genetic maps developed using molecular markers such as SSR, SNP, and DArT, along with advanced genotyping platforms like microarrays and next-generation sequencing (NGS), have significantly improved the precision and efficiency of genetic analyses. Case studies have demonstrated the successful application of these maps in breeding programs, resulting in the development of superior wheat varieties. Additionally, the integration of multi-omics and systems biology approaches has further deepened the understanding of the genetic and environmental interactions influencing wheat traits. The advancements in high-density genetic mapping have revolutionized wheat research and breeding, providing powerful tools for dissecting complex traits and accelerating the development of improved wheat varieties. Despite challenges related to technology, biology, and resources, ongoing innovations and strategic initiatives are poised to enhance the efficacy and impact of genetic mapping efforts. These findings underscore the critical role of high-density genetic mapping in achieving sustainable agricultural practices and ensuring global food security.
(The advance publishing of the abstract of this manuscript does not mean final published, the end result whether or not published will depend on the comments of peer reviewers and decision of our editorial board.)
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. Wheat
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